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QEX10 Solar Cell Quantum Efficiency / Spectral Response / IPCE Measurement System |
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QEX10 Solar Cell Quantum Efficiency / Spectral Response / IPCE Measurement System
The QEX10 Quantum Efficiency /Spectral Response / Incident Photon Conversion Efficiency Measurement System is the culmination of over 15 years of photovoltaics measurements and system design by a team dedicated to the advancement of photovoltaic device characterization.
General Description
The QEX10 uses a xenon arc lamp source, monochromator, filters and reflective optics to provide stable monochromatic light to a photovoltaic test device. A broadband bias light also illuminates the test device to simulate end-use conditions. The system uses a detection circuit designed to maximize measurement speed and accuracy for solar cell development.
Turn-key solution for solar cell analysis
System of choice by national laboratories
Mature product - over 200 QE systems in the field
Fast and easy installation
Excellent repeatability
Accurate measurements
Light bias current capability up to 150 mA
ASTM Method E 1021-06 compliant
DC mode measurement capability (optional)
Measures reflectance and IQE (optional)
Glove box accessory (optional)
Reflective Optical Path
There are no refractive focusing optics in the main beam path of the QEX10. This avoids chromatic aberrations.
Monitor Photodiode
The QEX10 performs simultaneous measurements of the device signal strength and the probe light intensity.
Calibration
The system includes a reference photodiode that is calibrated for spectral response and traceable to NIST.
Wavelength Range & Uncertainty
The basic system wavelength range is 300 nm to 1100 nm. Typical repeatability for p-n junction solar cells is better than ±0.3 % in the 400 nm to 1000 nm range and better than ±0.6 % in the 300 nm to 400 nm and 1000 nm to 1100 nm ranges.
Bias Light
The QEX10 illuminates a region on the sample approximately 1.5 cm in diameter with stable, broad-band bias light adjustable from 0 to 1.5 sun intensity. PVM also offers accessories to facilitate application of spectrally-selective bias light for multi-junction solar cell measurements, including multi-colored LED bias lights.
Monochromatic Light Modulation
The QEX10 spectral response measurement system uses an adjustable mechanical chopper to modulate the light. The DC Mode Option adds the capability to measure with unmodulated light.
Facility Requirements
The QEX10 requires 115 VAC, 10 A or 230 VAC, 5 A, 50 Hz to 60 Hz (please specify voltage and frequency with your order) and a sturdy table at least 1.5 m wide and 0.7 m deep (optical table not needed). The equipment is expected to operate in an environment with little dust, temperature between 20 °C and 27 °C, no organic vapors or corrosive fumes, and relative humidity < 60 %.
Basic System Features
User changeable monochromatic light spectral bandwidth
Monochromatic probe light with 300 nm to 1100 nm wavelength range
Selectable wavelength interval (default 10 nm)
Dual grating monochromator with computer control
Filter wheel with order-sorting and stray light attenuation fi lters
Calibrated reference photodiode, NIST traceable (one step)
Line fi lter for wavelength calibration verifi cation
Voltage bias capability ± 3.0 V
Computer system with easy-to-use graphical user interface
Data saved in text fi les for easy import into spreadsheets
Simultaneous measurement of device signal and light intensity
White bias light source (up to 5 suns) with fi lter options
Chopping speed 4 Hz to 200 Hz (1.3 Hz optional)
Measures Si cells in less than 3 minutes at 10 nm interval
Calculates Jsc estimate using reference spectrum AM1.5G or a spectrum of your choice
Complete scan in less than 45 seconds for 12 wavelengths (minimum required for ASTM E 1021-06)
Customer training at PVM headquarters in Boulder, Colorado, USA
Instruction manual
Spare Lamps
Options
300 nm to 1400 nm spectral range
300 nm to 1700 nm spectral range
Reflectance and IQE measurement capability or SIQE
1.3 Hz to 50 Hz chopping speed
DC mode measurement capability
Quick – swap filter assembly
LED bias lights
Dual white bias lights
Triple white bias lights
Beam-up operation
Setup and training at customer’s site
Accessories
Glove box interface
Clamp test fixture
Vacuum test fixture
Test fixture temperature control
X – Y scanning for response mapping
at any wavelength (coarse LBIC)
Custom test fixture
Reflectance & IQE
The Reflectance and IQE option includes the unique integrating sphere, designed to more accurately account for both diffuse and specular reflections.
DC & Low Frequency Measurement Modes
It is often useful to measure these devices with the optional slower modulated light at 1.3 Hz or DC light.
Test Fixtures
PVM offers a variety of vacuum and clamp test fixtures to hold and contact test devices.
Computer & Software
The system software controls the equipment, gathers the instrument readings, and maintains the calibration information.
太阳能电池测试系统,太阳能电池测量系统,测试仪,测量仪
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